8 results
Novel resistance reduction and phase changes of contacts to n-type InP by rapid thermal annealing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M5.47
- Print publication:
- 2002
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Energy Dispersive Spectrometry Calibration of Fe and Co
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 200-201
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- August 2001
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The Hitachi HD-2000 in Semicondutor Manufacturing Support and Research.
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 116-117
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- August 2000
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Enhancement of SEM/EDS Analysis Using FIB Sample Preparation
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 896-897
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- August 1999
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Effect of Surface Roughness on STEM Samples Prepared by FIB
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 906-907
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- August 1999
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The FIB Lift-Out Specimen Preparation Technique for TEM Analyses and Beyond: SEM, AUGER, STEM, and SIMS Applications
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 888-889
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- August 1999
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W, WSix and Ti/Al Low Resistance Ohmic Contacts to InGaN, InN and InAlN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 421 / 1996
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- 10 February 2011, 373
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- 1996
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Diffusion of Implanted Dopants and Isolation Species in III-V Nitrides
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- Journal:
- MRS Online Proceedings Library Archive / Volume 354 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 159
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- 1994
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